Pedro Luis Galindo Riaño
pedro.galindo@uca.es
956016434

• Pattern recognition: feature extraction, dimensionality reduction, etc.
• Digital treatment of images: filtration, segmentation, labeling, deconvolution, reconstruction, etc.
• Data analysis and modeling: finite element method.
• Statistical techniques: regression, classification and prediction.
• Nanotechnology: simulation of images from electron microscopy and modeling of nanostructures.
• Design of parallel software for supercomputing systems.