Pedro Luis Galindo Riaño
pedro.galindo@uca.es
956016434
- Pattern recognition: feature extraction, dimensionality reduction, etc.
- Digital treatment of images: filtration, segmentation, labeling, deconvolution, reconstruction, etc.
- Data analysis and modeling: finite element method.
- Statistical techniques: regression, classification and prediction.
- Nanotechnology: simulation of images from electron microscopy and modeling of nanostructures.
- Design of parallel software for supercomputing systems.
